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Found 159 books ICS 29.045

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	Format	Year	Publisher	Type	Title
		2023	IEC	Standards	IEC/TS 63394 Ed. 1.0 en:2023 Safety of machinery - Guidelines on functional safety of safety-related control system
		2021	BSI	Standards	21/30439740 DC BS 8442. Miscellaneous road traffic signs and devices. Requirements and test methods
		2022	BSI	Standards	BS EN ISO 13297:2020+A1:2022 Small craft. Electrical systems. Alternating and direct current installations
		2021	BSI	Standards	21/30422967 DC BS EN ISO 12696. Cathodic protection of steel in concrete
		2024	BSI	Standards	BS EN ISO 7817-1:2024 - TC Tracked Changes. Building Information Modelling. Level of Information Need - Concepts and principles
		2018	ASTM	Model Standard	D6063-11(2018) Standard Guide for Sampling of Drums and Similar Containers by Field Personnel
		2024	ASTM	Model Standard	E814-24 Standard Test Method for Fire Tests of Penetration Firestop Systems
		2022	ASTM	Model Standard	C876-22b Standard Test Method for Corrosion Potentials of Uncoated Reinforcing Steel in Concrete
		2024	IEC	Standards	IEC 62841-2-19 Ed. 1.0 b:2024 Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery - Safety - Part 2-19: Particular requirements for hand-held jointers
		2020	ASTM	Model Standard	D3084-20 Standard Practice for Alpha-Particle Spectrometry of Water
		2025	BSI	Standards	25/30530997 DC Draft BS EN IEC 62788-2-1/AMD1 ED1 Amendment 1 - Measurement procedures for materials used in photovoltaic modules - Part 2-1: Polymeric materials - Frontsheet and backsheet - Safety requirements
		2026	ASTM	Model Standard	E1323-26 Standard Guide for Evaluating Laboratory Measurement Practices and the Statistical Analysis of the Resulting Data
		2018	BSI	Standards	18/30374620 DC BS ISO 8827. Implants for surgery. Staples with parallel legs for orthopaedic use. General requirements
		2023	IEC	Standards	S+ IEC 60071-2 Ed. 5.0 en:2023 (Redline version) Insulation co-ordination - Part 2: Application guidelines
		2018	ISO	Standards	ISO 19835:2018 Non-destructive testing - Acoustic emission testing - Steel structures of overhead travelling cranes and portal bridge cranes
		2020	ASTM	Model Standard	C1647-20 Standard Practice for Removal of Uranium or Plutonium, or both, for Impurity Assay in Uranium or Plutonium Materials (Redline)
		2015	ASTM	Model Standard	D4280-15 Standard Specification for Extended Life Type, Nonplowable, Raised Retroreflective Pavement Markers
		1993	BSI	Standards	BS 2000-57:1993 Methods of test for petroleum and its products - Determination of smoke point
		2018	ASTM	Model Standard	E3183-18 Standard Guide for Harvesting Coal Combustion Products Stored in Active and Inactive Storage Areas for Beneficial Use
		2018	ASTM	Model Standard	A377-18 Standard Index of Specifications for Ductile Iron Pressure Pipe
		2020	ASTM	Model Standard	F2530-13(2020) Standard Specification for Protective Headgear with Faceguard Used in Bull Riding
		2018	ASTM	Model Standard	A1018/A1018M-18 Standard Specification for Steel, Sheet and Strip, Heavy-Thickness Coils, Hot-Rolled, Carbon, Commercial, Drawing, Structural, High-Strength Low-Alloy, High-Strength Low-Alloy with Improved Formability, and Ultra-High Strength
		2018	ISO	Standards	ISO 7240-5:2018 Fire detection and fire alarm systems - Part 5: Point type heat detectors
		2007	ASTM	Model Standard	D2175-97(2007) Standard Test Method for Book Bulk and Book Bulking Number of Paper (Withdrawn 2010)
		2025	IEC	Standards	IEC 60060-2 Ed. 4.0 b:2025 High-voltage test techniques - Part 2: Measuring systems
		1993	BSI	Standards	DD ENV 623-3:1993 Advanced technical ceramics. Monolithic ceramics. General and textural properties - Determination of grain size
		2019	BSI	Standards	BS EN IEC 62677-3-103:2019 Heat-shrinkable low and medium voltage moulded shapes - Specification for individual materials. Sheet 103: Heat-shrinkable, polyolefin, conductive moulded shapes for medium voltage applications
		2024	BSI	Standards	BS EN 50617-2:2024 - TC Tracked Changes. Railway applications. Technical parameters of train detection systems for the interoperability of the trans-European railway system - Axle counters
		2015	ASTM	Model Standard	E310-15 Standard Reference Radiographs for Tin Bronze Castings
		2025	BSI	Standards	BS EN IEC 60146-1-1:2024 Semiconductor converters. General requirements and line commutated converters - Specification of basic requirements
		2021	BSI	Standards	22/30439670 DC BS EN IEC 60146-1-1. Semiconductor converters. General requirements and line commutated converters - Part 1-1. Specification of basic requirements
		2021	BSI	Standards	21/30428334 DC BS EN IEC 62899-203. Printed electronics - Part 203. Materials. Semiconductor ink
		2021	BSI	Standards	BS IEC 62899-503-3:2021 Printed electronics - Quality assessment. Measuring method of contact resistance for the printed thin film transistor. Transfer length method
		2020	BSI	Standards	BS IEC 62899-503-1:2020 Printed electronics - Quality assessment. Test method of displacement current measurement for printed thin-film transistor
		2019	BSI	Standards	19/30393421 DC BS EN IEC 62899-503-3. Printed electronics - Part 503-3. Quality assessment. Measuring method of contact resistance for the printed thin film transistor by transfer length method
		2019	BSI	Standards	19/30355742 DC BS IEC 62899-503. Printed Electronics - Part 503. Quality Assessment. Test method for the channel properties of the printed thin-film transistor
		2019	ASTM	Model Standard	E1438-11(2019) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
		2019	BSI	Standards	PD IEC TR 60146-1-2:2019 Semiconductor converters. General requirements and line commutated converters - Application guide
		2018	ASTM	Model Standard	D6095-12(2018) Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
		2018	BSI	Standards	BS IEC 62899-203:2018 Printed electronics - Materials. Semiconductor ink
		2016	ASTM	Model Standard	F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
		2016	ASTM	Model Standard	F980-16 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices (Redline)
		2016	ASTM	Model Standard	F76-08(2016) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
		2016	ASTM	Model Standard	F76-08(2016)e1 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
		2013	ASTM	Model Standard	F615M-95(2013) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
		2013	ASTM	Model Standard	D3004-08(2013) Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
		2012	ASTM	Model Standard	D6095-12 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
		2011	ASTM	Model Standard	E1438-11 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
		2011	ASTM	Model Standard	F2113-01(2011) Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
		2011	ASTM	Model Standard	F1894-98(2011) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
		2011	BSI	Standards	PD IEC/TR 60146-1-2:2011 Semiconductor converters. General requirements and line commutated converters - Application guide
		2010	BSI	Standards	BS EN 60146-1-1:2010 Semiconductor converters. General requirements and line commutated converters - Specification of basic requirements
		2010	ASTM	Model Standard	F980-10 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
		2010	ASTM	Model Standard	F980-10e1 Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
		2008	ASTM	Model Standard	F615M-95(2008) Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
		2008	ASTM	Model Standard	F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
		2008	ASTM	Model Standard	F76-08 Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors (Redline)
		2008	ASTM	Model Standard	D3004-08 Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
		2008	ASTM	Model Standard	D3004-08 Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials (Redline)
		2007	ASTM	Model Standard	F2113-01(2007) Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
		2007	ASTM	Model Standard	F1404-92(2007) Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique
		2006	ASTM	Model Standard	D6095-06 Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
		2006	ASTM	Model Standard	E1438-06 Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
		2005	ASTM	Model Standard	D6095-05 Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
		2005	BSI	Standards	BS EN 62226-2-1:2005 Exposure to electric or magnetic fields in the low and intermediate frequency range. Methods for calculating the current density and internal electric field induced in the human body - Exposure to magnetic fields - 2D models
		2003	ASTM	Model Standard	F980M-96(2003) Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices [Metric]
		2003	ASTM	Model Standard	F1894-98(2003) Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
		2002	ASTM	Model Standard	F1239-02 Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)
		2002	ASTM	Model Standard	F1152-02 Standard Test Method for Dimensions of Notches on Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F1212-89(2002) Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers (Withdrawn 2008)
		2002	ASTM	Model Standard	F1188-02 Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline (Withdrawn 2003)
		2002	ASTM	Model Standard	F1049-02 Standard Practice for Shallow Etch Pit Detection on Silicon Wafers (Withdrawn 2003
		2002	ASTM	Model Standard	F1390-02 Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
		2002	ASTM	Model Standard	F1392-02 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe (Withdrawn 2003)
		2002	ASTM	Model Standard	F1393-02 Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe (Withdrawn 2003)
		2002	ASTM	Model Standard	F1366-92(2002) Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
		2002	ASTM	Model Standard	F374-02 Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure (Withdrawn 2003)
		2002	ASTM	Model Standard	F391-02 Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage (Withdrawn 2003)
		2002	ASTM	Model Standard	F397-02 Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe (Withdrawn 2003)
		2002	ASTM	Model Standard	F398-92(2002) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)
		2002	ASTM	Model Standard	F84-02 Standard Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe (Withdrawn 2003)
		2002	ASTM	Model Standard	F847-02 Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques (Withdrawn 2003)
		2002	ASTM	Model Standard	F1725-02 Standard Guide for Analysis of Crystallographic Perfection of Silicon Ingots (Withdrawn 2003)
		2002	ASTM	Model Standard	F1726-02 Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F1727-02 Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F1771-97(2002) Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique (Withdrawn 2003)
		2002	ASTM	Model Standard	F28-02 Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay (Withdrawn 2003)
		2002	ASTM	Model Standard	F358-83(2002) Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)
		2002	ASTM	Model Standard	F1527-02 Standard Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon (Withdrawn 2003)
		2002	ASTM	Model Standard	F1529-02 Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure
		2002	ASTM	Model Standard	F1530-02 Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
		2002	ASTM	Model Standard	F418-77(2002) Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008)
		2002	ASTM	Model Standard	F42-02 Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials (Withdrawn 2003)
		2002	ASTM	Model Standard	F950-02 Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching (Withdrawn 2003)
		2002	ASTM	Model Standard	F951-02 Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F978-02 Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques (Withdrawn 2003)
		2002	ASTM	Model Standard	F928-02 Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates (Withdrawn 2003)
		2002	ASTM	Model Standard	F1618-02 Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F1809-02 Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon (Withdrawn 2003)
		2002	ASTM	Model Standard	F1810-97(2002) Standard Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F673-02 Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Withdrawn 2003)
		2002	ASTM	Model Standard	F76-86(2002) Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
		2002	ASTM	Model Standard	F523-02 Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces (Withdrawn 2003)
		2002	ASTM	Model Standard	F533-02 Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
		2002	ASTM	Model Standard	F533-02a Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	F534-02 Standard Test Method for Bow of Silicon Wafers
		2002	ASTM	Model Standard	F534-02a Standard Test Method for Bow of Silicon Wafers (Withdrawn 2003)
		2002	ASTM	Model Standard	D3004-02 Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
		2001	ASTM	Model Standard	E1438-91(2001) Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
		2001	ASTM	Model Standard	F1152-93(2001) Standard Test Method for Dimensions of Notches on Silicon Wafers
		2001	ASTM	Model Standard	F81-01 Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers (Withdrawn 2003)
		2001	ASTM	Model Standard	F1724-01 Standard Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy (Withdrawn 2003)
		2001	ASTM	Model Standard	F2113-01e1 Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
		2001	ASTM	Model Standard	F951-01 Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
		2001	ASTM	Model Standard	F576-01 Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry (Withdrawn 2003)
		2001	ASTM	Model Standard	F672-01 Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe (Withdrawn 2003)
		2000	ASTM	Model Standard	F1241-95(2000) Standard Terminology of Silicon Technology (Withdrawn 2003)
		2000	ASTM	Model Standard	F110-00a Standard Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique (Withdrawn 2003)
		2000	ASTM	Model Standard	F1188-00 Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption
		2000	ASTM	Model Standard	F1049-00 Standard Practice for Shallow Etch Pit Detection on Silicon Wafers
		2000	ASTM	Model Standard	F1389-00 Standard Test Methods for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
		2000	ASTM	Model Standard	F1391-93(2000) Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 2003)
		2000	ASTM	Model Standard	F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
		2000	ASTM	Model Standard	F1630-00 Standard Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
		2000	ASTM	Model Standard	F374-00a Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
		2000	ASTM	Model Standard	F399-00a Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002)
		2000	ASTM	Model Standard	F81-00 Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
		2000	ASTM	Model Standard	F1526-95(2000) Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy (Withdrawn 2003)
		2000	ASTM	Model Standard	F1527-00 Standard Guide for Application of Silicon Standard Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon

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