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eLibrary > BS IEC 62945:2018 Radiation protection instrumentation. Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems >

BS IEC 62945:2018 Radiation protection instrumentation. Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems, 2018

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English [Go to Page]
CONTENTS
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions, abbreviated terms, quantities and units [Go to Page]
3.1 Terms and definitions
3.2 Abbreviated terms
3.3 Quantities and units
4 Imaging performance evaluation procedures [Go to Page]
4.1 General test performance requirements
4.2 Description of test articles
Figures [Go to Page]
Figure 1 – Reference axes for testing procedures
Figure 2 – Test article A
Figure 3 – Test article B
4.3 Manually recorded data [Go to Page]
4.3.1 Purpose
4.3.2 System data
Tables [Go to Page]
Table 1 – List of test methods and indicators measured [Go to Page]
4.3.3 Evaluation environment data
4.3.4 Comments
4.3.5 Deviations from specified methods
4.3.6 Presentation of results
4.4 Object length accuracy [Go to Page]
4.4.1 Purpose
Figure 4 – Format example for manually recorded data [Go to Page]
4.4.2 Test object description
4.4.3 Test method
Figure 5 – Object length test object [Go to Page]
4.4.4 Presentation of results
4.5 Path-length CT value and Zeff [Go to Page]
4.5.1 Purpose
4.5.2 Test object description
Figure 6 – Output from object length procedure when test article is submitted within angular tolerance
Figure 7 – Output from object length procedure when test article rotation is outside of angular tolerance [Go to Page]
4.5.3 Test method
Figure 8 – Path-length test object [Go to Page]
4.5.4 Presentation of results
4.6 Noise equivalent quanta (NEQ) [Go to Page]
4.6.1 Purpose
Figure 9 – Example plot of path-length test results [Go to Page]
4.6.2 Test object description
4.6.3 Test method
Figure 10 – NEQ test object [Go to Page]
4.6.4 Presentation of results
Table 2 – NEQ procedure results
4.7 CT value consistency [Go to Page]
4.7.1 Purpose
4.7.2 Test object description
4.7.3 Test method
4.7.4 Presentation of results
4.8 CT value uniformity and x-ray energy spectrum consistency [Go to Page]
4.8.1 Purpose
4.8.2 Test object description
4.8.3 Test method
Figure 11 – Z uniformity test object and streak artifact test object [Go to Page]
4.8.4 Presentation of results
Table 3 – CT value uniformity results
4.9 Streak artifacts [Go to Page]
4.9.1 Purpose
4.9.2 Test object description
4.9.3 Test method
Figure 12 – Pins in test object axial slice (large circle), midpoints between neighboring pin pairs (small circles), traced line, and rectangular ROI [Go to Page]
4.9.4 Presentation of results
Table 4 – Streak artifact procedure results
4.10 Slice sensitivity profile (SSP) [Go to Page]
4.10.1 Purpose
4.10.2 Test object description
4.10.3 Test method
Figure 13 – Slanted edge test object used to measure z resolution [Go to Page]
4.10.4 Presentation of results
4.11 Image registration [Go to Page]
4.11.1 Purpose
4.11.2 Test object description
Table 5 – SSP procedure results [Go to Page]
4.11.3 Test method
Figure 14 – Registration test object (not to scale)
Figure 15 – CT image of registration test object, slice plane 1
Figure 16 – Horizontal line profile through CT slice of the registration test object
Figure 17 – Projection image of the registration test object and vertical profile through image [Go to Page]
4.11.4 Presentation of results
5 Environmental requirements
Annex A (normative) Detailed test article specifications and drawings [Go to Page]
A.1 General
A.2 Commercial parts
A.3 Outer enclosure
Table A.1 – Commercial foils required for fabrication of CT value uniformity and x-ray energy spectrum consistency test object (4.8)
A.4 Detailed drawings of custom components
Figure A.1 – Assembly of Case A test article
Figure A.2 – Assembly of Case B test article
Figure A.3 – Test component sub-assembly of Case A test article (drawing 1 of 2)
Figure A.4 – Test component sub-assembly, Case A test article (drawing 2 of 2)
Figure A.5 – Test component sub-assembly, Case B test article (drawing 1 of 2)
Figure A.6 – Test component sub-assembly, Case B test article (drawing 2 of 2)
Figure A.7 – Sub-components for Case A cylinder test object
Figure A.8 – Ring sub-components for Case A cylinder test object
Figure A.9 – Pin sub-components for Case A cylinder test object (streak artifacts)
Figure A.10 – Al sub-component for image registration test object, Case A
Figure A.11 – POM sub-components for image registration test object, Case A
Figure A.12 – Cylinder test object (NEQ and CT value consistency), Case B
Figure A.13 – Object length test object, Cases A and B
Figure A.14 – Path length test object, Case A
Figure A.15 – SSP test object, Case B
Figure A.16 – Partition panel for component support, Cases A and B (drawing 1 of 4)
Figure A.17 – Partition panel for component support, Case A (drawing 2 of 4)
Figure A.18 – Partition panel for component support, Case B (drawing 3 of 4)
Figure A.19 – Partition panel for component support, Case B (drawing 4 of 4)
Figure A.20 – Component support rods, Cases A and B
Figure A.21 – Assembly washers, Cases A and B
Figure A.22 – Sub-assembly for Case A cylinder test object
Figure A.23 – Sub-assembly for Case A image registration test object
Annex B (informative) Example of reporting format [Go to Page]
B.1 General
B.2 Example report
Annex C (informative) Statistical guidance on multiple scans, summary statistics, and comparison of results [Go to Page]
C.1 General
C.2 Scenario A: Comparing a single CT system between its baseline and candidate (revised) configuration
C.3 Scenario B: Comparing a single (candidate) system against an existing historical population of systems
Bibliography [Go to Page]

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BS IEC 62945:2018 Radiation protection instrumentation. Measuring the imaging performance of X-ray computed tomography (CT) security-screening systems, 2018

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please select your company type below: