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ISO 19683:2017 Space systems - Design qualification and acceptance tests of small spacecraft and units >
ISO 19683:2017 Space systems - Design qualification and acceptance tests of small spacecraft and units, 2017
- Foreword
- Introduction
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Abbreviated terms
- 5 General requirements
- 5.1 Tailoring
- 5.2 Qualification test
- 5.3 Acceptance test
- 5.4 Proto-flight test
- 5.5 Retest
- 5.6 Test documentation
- 5.6.1 Test plan, specification and procedure
- 5.6.2 Test report
- 5.6.3 Datasheet for unit test results
- 5.7 Test conditions, tolerances and accuracies
- 5.8 Functional test
- 5.9 Design, verification and testing philosophy
- 6 Satellite system tests
- 6.1 Test items
- 6.2 Test level and duration
- 7 Unit tests
- 7.1 Test items
- 7.2 Test levels and duration
- 8 Test requirements
- 8.1 Electrical interface
- 8.1.1 Purpose of test
- 8.1.2 Test facilities and setup as basic requirements
- 8.1.3 Test article configuration
- 8.1.4 Monitoring during test
- 8.1.5 Test levels and duration
- 8.1.6 Test conditions and guidelines
- 8.2 Functional test
- 8.2.1 Purpose of test
- 8.2.2 Test facilities and setup as basic requirements
- 8.2.3 Test article configuration
- 8.2.4 Monitoring during test
- 8.2.5 Test levels and duration
- 8.2.6 Test conditions and guidelines
- 8.3 Mission test
- 8.3.1 Purpose of test
- 8.3.2 Test facilities and setup as basic requirements
- 8.3.3 Test article configuration
- 8.3.4 Monitoring during test
- 8.3.5 Test levels and duration
- 8.3.6 Test conditions and guidelines
- 8.4 Total Ionization Dose (TID) test
- 8.4.1 Purpose of test
- 8.4.2 Test facilities and setup as basic requirements
- 8.4.3 Test article configuration
- 8.4.4 Monitoring during test
- 8.4.5 Test levels and duration
- 8.4.6 Test conditions and guidelines
- 8.5 Single Event Effect (SEE) test
- 8.5.1 Purpose of test
- 8.5.2 Test facilities and setup as basic requirements
- 8.5.3 Test article configuration
- 8.5.4 Monitoring during test
- 8.5.5 Test levels and duration
- 8.5.6 Test conditions and guidelines
- 8.5.7 Test conditions and guidelines
- 8.6 Spacecraft Charging Induced Electrostatic Discharge (ESD) test
- 8.6.1 Purpose of test
- 8.6.2 Test facilities and setup as basic requirements
- 8.6.3 Test article configuration
- 8.6.4 Monitoring during test
- 8.6.5 Test levels and duration
- 8.6.6 Test conditions and guidelines
- 8.7 Electromagnetic Compatibility (EMC) test
- 8.7.1 Purpose of test
- 8.7.2 Test facilities and setup as basic requirements
- 8.7.3 Test article configuration
- 8.7.4 Monitoring during test
- 8.7.5 Test levels and duration
- 8.7.6 Test conditions and guidelines
- 8.8 Deployment test
- 8.8.1 Purpose of test
- 8.8.2 Test facilities and setup as basic requirements
- 8.8.3 Test article configuration
- 8.8.4 Monitoring during test
- 8.8.5 Test levels and duration
- 8.8.6 Test conditions and guidelines
- 8.9 Magnetic field test
- 8.10 Antenna pattern test
- 8.11 Alignment measurement
- 8.12 Physical property measurement
- 8.13 Launcher/Spacecraft interface test
- 8.14 Quasi-static load test
- 8.14.1 Purpose of test
- 8.14.2 Test facilities and setup as basic requirements
- 8.14.3 Test article configuration
- 8.14.4 Monitoring during test
- 8.14.5 Test levels and duration
- 8.14.6 Test conditions and guidelines
- 8.15 Modal survey
- 8.15.1 Purpose of test
- 8.15.2 Test facilities and setup as basic requirements
- 8.15.3 Test article configuration
- 8.15.4 Monitoring during test
- 8.15.5 Test levels and duration
- 8.15.6 Test conditions and guidelines
- 8.16 Sinusoidal vibration test
- 8.16.1 Purpose of test
- 8.16.2 Test facilities and setup as basic requirements
- 8.16.3 Test article configuration
- 8.16.4 Monitoring during test
- 8.16.5 Test levels and duration
- 8.16.6 Test conditions and guidelines
- 8.17 Random vibration test
- 8.17.1 Purpose of test
- 8.17.2 Test facilities and setup as basic requirements
- 8.17.3 Test article configuration
- 8.17.4 Monitoring during test
- 8.17.5 Test levels and duration
- 8.17.6 Test conditions and guidelines
- 8.18 Acoustic test
- 8.18.1 Purpose of test
- 8.18.2 Test facilities and setup as basic requirements
- 8.18.3 Test article configuration
- 8.18.4 Monitoring during test
- 8.18.5 Test levels and duration
- 8.18.6 Test conditions and guidelines
- 8.19 Shock test
- 8.19.1 Purpose of test
- 8.19.2 Test facilities and setup as basic requirements
- 8.19.3 Test article configuration
- 8.19.4 Monitoring during test
- 8.19.5 Test levels and duration
- 8.19.6 Test conditions and guidelines
- 8.20 Thermal balance test
- 8.20.1 Purpose of test
- 8.20.2 Test facilities and setup as basic requirements
- 8.20.3 Test article configuration
- 8.20.4 Monitoring during test
- 8.20.5 Test levels and duration
- 8.20.6 Test conditions and guidelines
- 8.21 Thermal vacuum test
- 8.21.1 Purpose of test
- 8.21.2 Test facilities and setup as basic requirements
- 8.21.3 Test article configuration
- 8.21.4 Monitoring during test
- 8.21.5 Test levels and duration
- 8.21.6 Test conditions and guidelines
- 8.22 Functional test in vacuum
- 8.22.1 Purpose of test
- 8.22.2 Test facilities and setup as basic requirements
- 8.22.3 Test article configuration
- 8.22.4 Monitoring during test
- 8.22.5 Test levels and duration
- 8.22.6 Test conditions and guidelines
- 8.23 Cold/Hot start test
- 8.23.1 Purpose of test
- 8.23.2 Test facilities and setup as basic requirements
- 8.23.3 Test article configuration
- 8.23.4 Monitoring during test
- 8.23.5 Test levels and duration
- 8.23.6 Test conditions and guidelines
- 8.24 Thermal cycle functional test
- 8.24.1 Purpose of test
- 8.24.2 Test facilities and setup as basic requirements
- 8.24.3 Test article configuration
- 8.24.4 Monitoring during test
- 8.24.5 Test levels and duration
- 8.24.6 Test conditions and guidelines
- 8.25 Thermal cycle endurance test
- 8.25.1 Purpose of test
- 8.25.2 Test facilities and setup as basic requirements
- 8.25.3 Test article configuration
- 8.25.4 Monitoring during test
- 8.25.5 Test levels and duration
- 8.25.6 Test conditions and guidelines
- 8.26 Pressure test
- 8.27 Leakage test
- 8.28 Microvibration test
- 8.28.1 Purpose of test
- 8.28.2 Test facilities and setup as basic requirements
- 8.28.3 Test article configuration
- 8.28.4 Monitoring during test
- 8.28.5 Test levels and duration
- 8.28.6 Test conditions and guidelines
- 8.29 Burn-in and wear-in test
- 8.30 End-to-end mission simulation
- 8.30.1 Purpose of test
- 8.30.2 Test facilities and setup as basic requirements
- 8.30.3 Test article configuration
- 8.30.4 Monitoring during test
- 8.30.5 Test levels and duration
- 8.30.6 Test conditions and guidelines
- 8.31 Bake out and outgas test
- 8.31.1 Purpose of test
- 8.31.2 Test facilities and setup as basic requirements
- 8.31.3 Test article configuration
- 8.31.4 Monitoring during test
- 8.31.5 Test levels and duration
- 8.31.6 Test conditions and guidelines
- 8.32 Tailoring and waiver guides
- Annex A (normative) Tailoring and waiver guides
- Annex B (informative) Basis of test levels and duration
- Annex C (informative) Design, verification and testing philosophy for small spacecrafts
- Annex D (informative) Test selection logic flow
- Annex E (informative) Environment stress screening and burn-in
- Annex F (informative) Thermal vacuum or thermal cycle?
- Bibliography [Go to Page]