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S+ IEC 60384-21 Ed. 3.0 en:2019 (Redline version) Fixed capacitors for use in electronic equipment - Part 21: Sectional specification - Fixed surface mount multilayer capacitors of ceramic dielectric, Class 1, 2019
- Redline version (English only) [Go to Page]
- CONTENTS
- FOREWORD
- 1 General
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Information to be given in a detail specification [Go to Page]
- 4.1 General
- 4.2 Outline drawing and dimensions
- 4.3 Mounting
- 4.4 Rating and characteristics [Go to Page]
- 4.4.1 General
- 4.4.2 Nominal capacitance range
- 4.4.3 Particular characteristics
- 4.4.4 Soldering
- 4.5 Marking
- 5 Marking [Go to Page]
- 5.1 General
- 5.2 Information for marking
- 5.3 Marking on the body
- 5.4 Requirements for marking
- 5.5 Marking of the packaging
- 5.6 Additional marking
- 6 Preferred ratings and characteristics [Go to Page]
- 6.1 Preferred characteristics
- 6.2 Preferred values of ratings [Go to Page]
- 6.2.1 Rated temperature (TR)
- 6.2.2 Rated voltage (UR)
- 6.2.3 Category voltage (UC)
- 6.2.4 Preferred values of nominal capacitance and associated tolerance values
- 6.2.5 Temperature coefficient (α)
- 6.2.6 Dimensions
- 7 Quality assessment procedures [Go to Page]
- 7.1 Primary stage of manufacture
- 7.2 Structurally similar components
- 7.3 Certified records of released lots
- 7.4 Qualification approval [Go to Page]
- 7.4.1 General
- 7.4.2 Qualification approval on the basis of the fixed sample size procedures
- 7.4.3 Tests
- 7.5 Quality conformance inspection [Go to Page]
- 7.5.1 Formation of inspection lots
- 7.5.2 Test schedule
- 7.5.3 Delayed delivery
- 7.5.4 Assessment levels
- 8 Test and measurement procedures [Go to Page]
- 8.1 General
- 8.2 Preliminary drying
- 8.3 Measuring conditions
- 8.4 Mounting
- 8.5 Visual examination and check of dimensions [Go to Page]
- 8.5.1 General
- 8.5.2 Visual examination
- 8.5.3 Requirements
- 8.6 Electrical tests [Go to Page]
- 8.6.1 Capacitance
- 8.6.2 Tangent of loss angle (tan δ )
- 8.6.3 Insulation resistance
- 8.6.4 Voltage proof
- 8.7 Temperature coefficient (α ) and temperature cycle drift [Go to Page]
- 8.7.1 General
- 8.7.2 Preliminary drying
- 8.7.3 Measuring conditions
- 8.7.4 Requirements
- 8.8 Shear test
- 8.9 Substrate bending test [Go to Page]
- 8.9.1 General
- 8.9.2 Initial measurement
- 8.9.3 Final inspection
- 8.10 Resistance to soldering heat [Go to Page]
- 8.10.1 General
- 8.10.2 Initial measurement
- 8.10.3 Test conditions
- 8.10.4 Recovery
- 8.10.5 Final inspection, measurements and requirements
- 8.11 Solderability [Go to Page]
- 8.11.1 General
- 8.11.2 Test conditions
- 8.11.3 Recovery
- 8.11.4 Final inspection, measurements and requirements
- 8.12 Rapid change of temperature [Go to Page]
- 8.12.1 General
- 8.12.2 Initial measurement
- 8.12.3 Number of cycles
- 8.12.4 Recovery
- 8.12.5 Final inspection, measurements and requirements
- 8.13 Climatic sequence [Go to Page]
- 8.13.1 General
- 8.13.2 Initial measurement
- 8.13.3 Dry heat
- 8.13.4 Damp heat, cyclic, Test Db, first cycle
- 8.13.5 Cold
- 8.13.6 Damp heat, cyclic, Test Db, remaining cycles
- 8.13.7 Final inspection, measurements and requirements
- 8.14 Damp heat, steady state [Go to Page]
- 8.14.1 General
- 8.14.2 Initial measurement
- 8.14.3 Test conditions
- 8.14.4 Recovery
- 8.14.5 Final inspection, measurements and requirements
- 8.15 Endurance [Go to Page]
- 8.15.1 General
- 8.15.2 Initial measurement
- 8.15.3 Test conditions
- 8.15.4 Recovery
- 8.15.5 Final inspection, measurements and requirements
- 8.16 Robustness of terminations (only for capacitors with strip termination) [Go to Page]
- 8.16.1 General
- 8.16.2 Test conditions
- 8.16.3 Final inspection and requirements
- 8.17 Component solvent resistance (if required)
- 8.18 Solvent resistance of the marking (if required)
- 8.19 Accelerated damp heat, steady state (if required) [Go to Page]
- 8.19.1 General
- 8.19.2 Initial measurement
- 8.19.3 Conditioning
- 8.19.4 Recovery
- 8.19.5 Final measurements
- Annex A(normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
- Annex B (informative) Combination of temperature coefficient and tolerance for the reference temperature of 25 °C
- Annex X (informative) Cross-reference for reference to IEC 60384-21:2011
- Bibliography
- Figures [Go to Page]
- Figure 1 – Fault: crack or fissure
- Figure 2 – Fault: crack or fissure
- Figure 3 – Separation or delamination
- Figure 4 – Exposed electrodes
- Figure 5 – Principal faces
- Figure 6 – Reflow temperature profile
- Figure A.1 – Dimensions
- Tables [Go to Page]
- Table 1 – Preferred tolerances on nominal capacitance
- Table 2 – Nominal temperature coefficient and tolerance
- Table 3 – Combination of temperature coefficient and tolerance
- Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ
- Table 5 – Tests schedule for qualification approval
- Table 6 – Lot-by-lot inspection
- Table 7 – Periodic tests
- Table 8 – Tangent of loss angle limits
- Table 9 – Test voltages
- Table 10 – Temperature cyclic drift limits
- Table 11 – Reflow temperature profiles for Sn-Ag-Cu alloy
- Table 12 – Maximum capacitance change
- Table 13 – Maximum capacitance change
- Table 14 – Number of damp heat cycles
- Table 15 – Final inspection, measurements and requirements
- Table 16 – Test conditions for damp heat, steady state
- Table 17 – Final inspection, measurements and requirements
- Table 18 – Endurance test conditions (UC = UR)
- Table 19 – Endurance test conditions (UC ≠ UR)
- Table 20 – Final inspection, measurements and requirements
- Table 21 – Initial requirements
- Table 22 – Conditioning
- Table A.1 – Dimensions
- Table B.1 – Combination of temperature coefficient and tolerance for the reference temperature of 25 °C
- Table X.1 – Reference to IEC 60384-21 for clause/subclause
- Table X.2 – Reference to IEC 60384-21 for figure/table
- International standard (Bilingual) [Go to Page]
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Information to be given in a detail specification [Go to Page]
- 4.1 General
- 4.2 Outline drawing and dimensions
- 4.3 Mounting
- 4.4 Rating and characteristics [Go to Page]
- 4.4.1 General
- 4.4.2 Nominal capacitance range
- 4.4.3 Particular characteristics
- 4.4.4 Soldering
- 4.5 Marking
- 5 Marking [Go to Page]
- 5.1 General
- 5.2 Information for marking
- 5.3 Marking on the body
- 5.4 Requirements for marking
- 5.5 Marking of the packaging
- 5.6 Additional marking
- 6 Preferred ratings and characteristics [Go to Page]
- 6.1 Preferred characteristics
- 6.2 Preferred values of ratings [Go to Page]
- 6.2.1 Rated temperature (TR)
- 6.2.2 Rated voltage (UR)
- 6.2.3 Category voltage (UC)
- 6.2.4 Preferred values of nominal capacitance and associated tolerance values
- 6.2.5 Temperature coefficient (α )
- 6.2.6 Dimensions
- 7 Quality assessment procedures [Go to Page]
- 7.1 Primary stage of manufacture
- 7.2 Structurally similar components
- 7.3 Certified records of released lots
- 7.4 Qualification approval [Go to Page]
- 7.4.1 General
- 7.4.2 Qualification approval on the basis of the fixed sample size procedures
- 7.4.3 Tests
- 7.5 Quality conformance inspection [Go to Page]
- 7.5.1 Formation of inspection lots
- 7.5.2 Test schedule
- 7.5.3 Delayed delivery
- 7.5.4 Assessment levels
- 8 Test and measurement procedures [Go to Page]
- 8.1 General
- 8.2 Preliminary drying
- 8.3 Measuring conditions
- 8.4 Mounting
- 8.5 Visual examination and check of dimensions [Go to Page]
- 8.5.1 General
- 8.5.2 Visual examination
- 8.5.3 Requirements
- 8.6 Electrical tests [Go to Page]
- 8.6.1 Capacitance
- 8.6.2 Tangent of loss angle (tan δ )
- 8.6.3 Insulation resistance
- 8.6.4 Voltage proof
- 8.7 Temperature coefficient (α ) and temperature cycle drift [Go to Page]
- 8.7.1 General
- 8.7.2 Preliminary drying
- 8.7.3 Measuring conditions
- 8.7.4 Requirements
- 8.8 Shear test
- 8.9 Substrate bending test [Go to Page]
- 8.9.1 General
- 8.9.2 Initial measurement
- 8.9.3 Final inspection
- 8.10 Resistance to soldering heat [Go to Page]
- 8.10.1 General
- 8.10.2 Initial measurement
- 8.10.3 Test conditions
- 8.10.4 Recovery
- 8.10.5 Final inspection, measurements and requirements
- 8.11 Solderability [Go to Page]
- 8.11.1 General
- 8.11.2 Test conditions
- 8.11.3 Recovery
- 8.11.4 Final inspection, measurements and requirements
- 8.12 Rapid change of temperature [Go to Page]
- 8.12.1 General
- 8.12.2 Initial measurement
- 8.12.3 Number of cycles
- 8.12.4 Recovery
- 8.12.5 Final inspection, measurements and requirements
- 8.13 Climatic sequence [Go to Page]
- 8.13.1 General
- 8.13.2 Initial measurement
- 8.13.3 Dry heat
- 8.13.4 Damp heat, cyclic, Test Db, first cycle
- 8.13.5 Cold
- 8.13.6 Damp heat, cyclic, Test Db, remaining cycles
- 8.13.7 Final inspection, measurements and requirements
- 8.14 Damp heat, steady state [Go to Page]
- 8.14.1 General
- 8.14.2 Initial measurement
- 8.14.3 Test conditions
- 8.14.4 Recovery
- 8.14.5 Final inspection, measurements and requirements
- 8.15 Endurance [Go to Page]
- 8.15.1 General
- 8.15.2 Initial measurement
- 8.15.3 Test conditions
- 8.15.4 Recovery
- 8.15.5 Final inspection, measurements and requirements
- 8.16 Robustness of terminations (only for capacitors with strip termination) [Go to Page]
- 8.16.1 General
- 8.16.2 Test conditions
- 8.16.3 Final inspection and requirements
- 8.17 Component solvent resistance (if required)
- 8.18 Solvent resistance of the marking (if required)
- 8.19 Accelerated damp heat, steady state (if required) [Go to Page]
- 8.19.1 General
- 8.19.2 Initial measurement
- 8.19.3 Conditioning
- 8.19.4 Recovery
- 8.19.5 Final measurements
- Annex A (normative) Guidance for the specification and coding of dimensions of fixed surface mount multilayer capacitors of ceramic dielectric, Class 1
- Annex B (informative) Combination of temperature coefficient and tolerance for the reference temperature of 25 °C
- Annex X (informative) Cross-reference for reference to IEC 60384-21:2011
- Bibliography
- Figures [Go to Page]
- Figure 1 – Fault: crack or fissure
- Figure 2 – Fault: crack or fissure
- Figure 3 – Separation or delamination
- Figure 4 – Exposed electrodes
- Figure 5 – Principal faces
- Figure 6 – Reflow temperature profile
- Figure A.1 – Dimensions
- Tables [Go to Page]
- Table 1 – Preferred tolerances on nominal capacitance
- Table 2 – Nominal temperature coefficient and tolerance
- Table 3 – Combination of temperature coefficient and tolerance
- Table 4 – Fixed sample size test plan for qualification approval – Assessment level EZ
- Table 5 – Tests schedule for qualification approval
- Table 6 – Lot-by-lot inspection
- Table 7 – Periodic tests
- Table 8 – Tangent of loss angle limits
- Table 9 – Test voltages
- Table 10 – Temperature cyclic drift limits
- Table 11 – Reflow temperature profiles for Sn-Ag-Cu alloy
- Table 12 – Maximum capacitance change
- Table 13 – Maximum capacitance change
- Table 14 – Number of damp heat cycles
- Table 15 – Final inspection, measurements and requirements
- Table 16 – Test conditions for damp heat, steady state
- Table 17 – Final inspection, measurements and requirements
- Table 18 – Endurance test conditions (UC = UR)
- Table 19 – Endurance test conditions (UC ≠ UR)
- Table 20 – Final inspection, measurements and requirements
- Table 21 – Initial requirements
- Table 22 – Conditioning
- Table A.1 – Dimensions
- Table B.1 – Combination of temperature coefficient and tolerance for the reference temperature of 25 °C
- Table X.1 – Reference to IEC 60384-21 for clause/subclause
- Table X.2 – Reference to IEC 60384-21 for figure/table
- Français [Go to Page]
- SOMMAIRE
- AVANT-PROPOS
- 1 Domaine d'application
- 2 Références normatives
- 3 Termes et définitions
- 4 Informations devant figurer dans une spécification particulière [Go to Page]
- 4.1 Généralités
- 4.2 Dessin d'encombrement et dimensions
- 4.3 Montage
- 4.4 Valeurs assignées et caractéristiques [Go to Page]
- 4.4.1 Généralités
- 4.4.2 Plage de capacités nominales
- 4.4.3 Caractéristiques particulières
- 4.4.4 Brasage
- 4.5 Marquage
- 5 Marquage [Go to Page]
- 5.1 Généralités
- 5.2 Informations relatives au marquage
- 5.3 Marquage sur le corps
- 5.4 Exigences relatives au marquage
- 5.5 Marquage de l'emballage
- 5.6 Marquage supplémentaire
- 6 Valeurs assignées et caractéristiques préférentielles [Go to Page]
- 6.1 Caractéristiques préférentielles
- 6.2 Valeurs assignées préférentielles [Go to Page]
- 6.2.1 Température assignée (TR)
- 6.2.2 Tension assignée (UR)
- 6.2.3 Tension de catégorie (UC)
- 6.2.4 Valeurs préférentielles de capacité nominale et valeurs de tolérance associées
- 6.2.5 Coefficient de température (α )
- 6.2.6 Dimensions
- 7 Procédures d'assurance de la qualité [Go to Page]
- 7.1 Etape initiale de fabrication
- 7.2 Modèles associables
- 7.3 Enregistrements certifiés de lots livrés
- 7.4 Homologation [Go to Page]
- 7.4.1 Généralités
- 7.4.2 Homologation fondée sur les procédures avec un nombre d'échantillons fixe
- 7.4.3 Essais
- 7.5 Contrôle de conformité de la qualité [Go to Page]
- 7.5.1 Formation des lots de contrôle
- 7.5.2 Programme d'essais
- 7.5.3 Livraison différée
- 7.5.4 Niveaux d'assurance
- 8 Procédures d'essais et de mesures [Go to Page]
- 8.1 Généralités
- 8.2 Séchage préliminaire
- 8.3 Conditions de mesure
- 8.4 Montage
- 8.5 Examen visuel et contrôle des dimensions [Go to Page]
- 8.5.1 Généralités
- 8.5.2 Examen visuel
- 8.5.3 Exigences
- 8.6 Essais électriques [Go to Page]
- 8.6.1 Capacité
- 8.6.2 Tangente de l'angle de perte (tan δ )
- 8.6.3 Résistance d'isolement
- 8.6.4 Tenue en tension
- 8.7 Coefficient de température (α ) et dérive cyclique de température [Go to Page]
- 8.7.1 Généralités
- 8.7.2 Séchage préliminaire
- 8.7.3 Conditions de mesure
- 8.7.4 Exigences
- 8.8 Essai de cisaillement
- 8.9 Essai de courbure du substrat [Go to Page]
- 8.9.1 Généralités
- 8.9.2 Mesure initiale
- 8.9.3 Contrôle final
- 8.10 Résistance à la chaleur de brasage [Go to Page]
- 8.10.1 Généralités
- 8.10.2 Mesure initiale
- 8.10.3 Conditions d'essai
- 8.10.4 Rétablissement
- 8.10.5 Exigences, mesures et contrôle final
- 8.11 Brasabilité [Go to Page]
- 8.11.1 Généralités
- 8.11.2 Conditions d'essai
- 8.11.3 Rétablissement
- 8.11.4 Exigences, mesures et contrôle final
- 8.12 Variations rapides de température [Go to Page]
- 8.12.1 Généralités
- 8.12.2 Mesure initiale
- 8.12.3 Nombre de cycles
- 8.12.4 Rétablissement
- 8.12.5 Exigences, mesures et contrôle final
- 8.13 Séquence climatique [Go to Page]
- 8.13.1 Généralités
- 8.13.2 Mesure initiale
- 8.13.3 Chaleur sèche
- 8.13.4 Chaleur humide, cyclique, Essai Db, premier cycle
- 8.13.5 Froid
- 8.13.6 Chaleur humide, cyclique, essai Db, cycles restants
- 8.13.7 Exigences, mesures et contrôle final
- 8.14 Chaleur humide, essai continu [Go to Page]
- 8.14.1 Généralités
- 8.14.2 Mesure initiale
- 8.14.3 Conditions d'essai
- 8.14.4 Rétablissement
- 8.14.5 Exigences, mesures et contrôle final
- 8.15 Endurance [Go to Page]
- 8.15.1 Généralités
- 8.15.2 Mesure initiale
- 8.15.3 Conditions d'essai
- 8.15.4 Rétablissement
- 8.15.5 Exigences, mesures et contrôle final
- 8.16 Robustesse des sorties (uniquement pour les condensateurs munis de sorties à lamelle) [Go to Page]
- 8.16.1 Généralités
- 8.16.2 Conditions d'essai
- 8.16.3 Exigences et contrôle final
- 8.17 Résistance au solvant des composants (si cela est exigé)
- 8.18 Résistance au solvant du marquage (si cela est exigé)
- 8.19 Chaleur humide, essai continu accéléré (si cela est exigé) [Go to Page]
- 8.19.1 Généralités
- 8.19.2 Mesure initiale
- 8.19.3 Conditionnement
- 8.19.4 Rétablissement
- 8.19.5 Mesures finales
- Annexe A (normative) Recommandations pour la spécification et le codage des dimensions des condensateurs multicouches fixes à diélectriques en céramique pour montage en surface, Classe 1
- Annexe B (informative) Combinaison du coefficient de température et de la tolérance pour la température de référence de 25 °C
- Annexe X (informative) Correspondance des références avec l'IEC 60384-21:2011
- Bibliographie
- Figures [Go to Page]
- Figure 1 – Défaut: craquelure ou fissure
- Figure 2 – Défaut: craquelure ou fissure
- Figure 3 – Séparation ou décollement interlaminaire
- Figure 4 – Electrodes exposées
- Figure 5 – Faces principales
- Figure 6 – Profil de température de refusion
- Figure A.1 – Dimensions
- Tableaux [Go to Page]
- Tableau 1 – Tolérances préférentielles sur la capacité nominale
- Tableau 2 – Coefficient de température nominale et tolérance
- Tableau 3 – Combinaisons de coefficient de température et de tolérance
- Tableau 4 – Plan d'essais avec un nombre d'échantillons fixe pour homologation – Niveau d'assurance EZ
- Tableau 5 – Programme d'essais pour homologation
- Tableau 6 – Contrôle lot par lot
- Tableau 7 – Essais périodiques
- Tableau 8 – Limites de la tangente de l'angle de perte
- Tableau 9 – Tensions d'essai
- Tableau 10 – Limites de dérive après cycle thermique
- Tableau 11 – Profils de température de refusion pour alliage Sn-Ag-Cu
- Tableau 12 – Variation maximale de capacité
- Tableau 13 – Variation maximale de capacité
- Tableau 14 – Nombre de cycles de chaleur humide
- Tableau 15 – Exigences, mesures et contrôle final
- Tableau 16 – Conditions d'essai continu de chaleur humide
- Tableau 17 – Exigences, mesures et contrôle final
- Tableau 18 – Conditions d'essai d'endurance (UC = UR)
- Tableau 19 – Conditions d'essai d'endurance (UC ≠ UR)
- Tableau 20 – Exigences, mesures et contrôle final
- Tableau 21 – Exigences initiales
- Tableau 22 – Conditionnement
- Tableau A.1 – Dimensions
- Tableau B.1 – Combinaison du coefficient de température et de la tolérance pour la température de référence de 25 °C
- Tableau X.1 – Référence à l'IEC 60384-21 pour les articles/paragraphes
- Tableau X.2 – Référence à l'IEC 60384-21 pour les figures/tableaux [Go to Page]