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S+ IEC 60384-8 Ed. 5.0 en:2024 (Redline version) Fixed capacitors for use in electronic equipment - Part 8: Sectional specification - Fixed capacitors of ceramic dielectric, Class 1, 2024
- Redline version (English only) [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Preferred ratings and characteristics [Go to Page]
- 4.1 Preferred characteristics
- 4.2 Preferred values of ratings [Go to Page]
- 4.2.1 Rated temperature
- 4.2.2 Rated voltage (UR)
- 4.2.3 Category voltage (UC)
- 4.2.4 Preferred values of nominal capacitance and associated tolerance values
- 4.2.5 Temperature coefficient (α)
- 5 Test and measurement procedures [Go to Page]
- 5.1 General
- 5.2 Visual examination and check of dimensions
- 5.3 Electrical tests [Go to Page]
- 5.3.1 Capacitance
- 5.3.2 Tangent of loss angle (tan δ)
- 5.3.3 Insulation resistance (Ri)
- 5.3.4 Voltage proof
- 5.4 Temperature coefficient (α) and temperature cyclic drift of capacitance [Go to Page]
- 5.4.1 General
- 5.4.2 Preliminary drying
- 5.4.3 Measuring conditions
- 5.4.4 Requirements
- 5.5 Robustness of terminations
- 5.6 Resistance to soldering heat [Go to Page]
- 5.6.1 General
- 5.6.2 Initial measurement
- 5.6.3 Test conditions
- 5.6.4 Final inspection, measurements and requirements
- 5.7 Solderability [Go to Page]
- 5.7.1 General
- 5.7.2 Test conditions
- 5.7.3 Final inspection, measurements and requirements
- 5.8 Rapid change of temperature (if required) [Go to Page]
- 5.8.1 General
- 5.8.2 Initial measurement
- 5.8.3 Test conditions
- 5.8.4 Recovery
- 5.9 Vibration [Go to Page]
- 5.9.1 General
- 5.9.2 Test conditions
- 5.9.3 Final inspection, measurements and requirements
- 5.10 Bump (repetitive shock) [Go to Page]
- 5.10.1 General
- 5.10.2 Initial measurements
- 5.10.3 Test conditions
- 5.10.4 Final inspection, measurements and requirements
- 5.11 Shock (non-repetitive shock) [Go to Page]
- 5.11.1 General
- 5.11.2 Initial measurements
- 5.11.3 Test conditions
- 5.11.4 Final inspection, measurements and requirements
- 5.12 Climatic sequence [Go to Page]
- 5.12.1 General
- 5.12.2 Initial measurements
- 5.12.3 Dry heat
- 5.12.4 Damp heat, cyclic, Test Db, first cycle
- 5.12.5 Cold
- 5.12.6 Low air pressure
- 5.12.7 Damp heat, cyclic, Test Db, remaining cycles
- 5.13 Damp heat, steady state [Go to Page]
- 5.13.1 General
- 5.13.2 Initial measurement
- 5.13.3 Test conditions
- 5.13.4 Recovery
- 5.13.5 Final inspection, measurements and requirements
- 5.14 Endurance [Go to Page]
- 5.14.1 General
- 5.14.2 Initial measurement
- 5.14.3 Test conditions
- 5.14.4 Recovery
- 5.14.5 Final inspection, measurements and requirements
- 5.15 Component solvent resistance (if required)
- 5.16 Solvent resistance of the marking (if required)
- 6 Marking [Go to Page]
- 6.1 General
- 6.2 Information for marking
- 6.3 Marking for code of temperature coefficient
- 6.4 Marking on the body
- 6.5 Marking of the packaging
- 6.6 Additional marking
- 7 Information to be given in a detail specification [Go to Page]
- 7.1 General
- 7.2 Outline drawing and dimensions
- 7.3 Mounting
- 7.4 Ratings and characteristics [Go to Page]
- 7.4.1 General
- 7.4.2 Nominal capacitance range
- 7.4.3 Particular characteristics
- 7.4.4 Soldering
- 7.5 Marking
- 8 Quality assessment procedures [Go to Page]
- 8.1 Primary stage of manufacture
- 8.2 Structurally similar components
- 8.3 Certified test records of released lots
- 8.4 Qualification approval [Go to Page]
- 8.4.1 General
- 8.4.2 Qualification approval on the basis of the fixed sample size procedure
- 8.4.3 Tests
- Annexes [Go to Page]
- Annex A (informative) Figures with limits of variation of capacitance with temperature for certain temperature coefficients and classes
- Annex B (normative) Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
- Annex C (normative) Quality conformance inspection [Go to Page]
- C.1 Formation of inspection lots [Go to Page]
- C.1.1 Groups A and B inspection
- C.1.2 Group C inspection
- C.2 Test schedule
- C.3 Delayed delivery
- C.4 Assessment levels
- C.5 Test schedule for quality conformance inspection
- Annex X (informative) Comparison of cross-references in relation to IEC 60384-8:2015
- Bibliography
- Figures [Go to Page]
- Figure A.1 – α: +100 (10–6/K)
- Figure A.2 – α: 0 (10–6/K)
- Figure A.3 – α: −33 (10–6/K)
- Figure A.4 – α: −75 (10–6/K)
- Figure A.5 – α: −150 (10–6/K)
- Figure A.6 – α: −220 (10–6/K)
- Figure A.7 – α: −330 (10–6/K)
- Figure A.8 – α: −470 (10–6/K)
- Figure A.9 – α: −750 (10–6/K)
- Figure A.10 – α: −1 000 (10–6/K)
- Figure A.11 – α: −1 500 (10–6/K)
- Figure A.12 – α: −2 200 (10–6/K)
- Figure A.13 – α: −3 300 (10–6/K)
- Figure A.14 – α: −4 700 (10–6/K)
- Figure A.15 – α: −5 600 (10–6/K)
- Tables [Go to Page]
- Table 1 – Preferred tolerances on nominal capacitance
- Table 2 – Nominal temperature coefficient and tolerance for reference temperature 20 °C
- Table 3 – Combination of temperature coefficient and tolerance
- Table 4 – Tangent of loss angle
- Table 5 – Insulation resistance requirements
- Table 6 – Test voltages for single layer ceramic capacitors
- Table 7 – Test voltages for leaded multilayer ceramic capacitors
- Table 8 – Temperature cyclic drift limits
- Table 9 – Requirements
- Table 10 – Preferred severities (of non-repetitive shock)
- Table 11 – Maximum capacitance change
- Table 12 – Number of damp heat cycles
- Table 13 – Final inspection, measurements and requirements
- Table 14 –Test conditions for damp heat, steady state
- Table 15 – Final inspection, measurements and requirements
- Table 16 – Endurance test conditions
- Table 17 – Final inspection, measurements and requirements
- Table 18 – Sampling plan together with numbers of permissible non-conforming items for qualification approval tests, assessment level EZ
- Table 19 – Test schedule for qualification approval
- Table B.1 – Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
- Table C.1 – Lot-by-lot inspection
- Table C.2 – Periodic tests
- Table C.3 – Test schedule for quality conformance inspection (lot by lot)
- Table C.4 – Test schedule for quality conformance inspection (Periodic test)
- Table X.1 – Comparison of cross-references between this document and the previous edition of IEC 60384-8 for clauses/subclauses/annexes
- Table X.2 – Reference to IEC 60384-8 for figure/table
- International standard (Bilingual) [Go to Page]
- English [Go to Page]
- CONTENTS
- FOREWORD
- 1 Scope
- 2 Normative references
- 3 Terms and definitions
- 4 Preferred ratings and characteristics [Go to Page]
- 4.1 Preferred characteristics
- 4.2 Preferred values of ratings [Go to Page]
- 4.2.1 Rated temperature
- 4.2.2 Rated voltage (UR)
- 4.2.3 Category voltage (UC)
- 4.2.4 Preferred values of nominal capacitance and associated tolerance values
- 4.2.5 Temperature coefficient (α)
- 5 Test and measurement procedures [Go to Page]
- 5.1 General
- 5.2 Visual examination and check of dimensions
- 5.3 Electrical tests [Go to Page]
- 5.3.1 Capacitance
- 5.3.2 Tangent of loss angle (tan δ)
- 5.3.3 Insulation resistance (Ri)
- 5.3.4 Voltage proof
- 5.4 Temperature coefficient (α) and temperature cyclic drift of capacitance [Go to Page]
- 5.4.1 General
- 5.4.2 Preliminary drying
- 5.4.3 Measuring conditions
- 5.4.4 Requirements
- 5.5 Robustness of terminations
- 5.6 Resistance to soldering heat [Go to Page]
- 5.6.1 General
- 5.6.2 Initial measurement
- 5.6.3 Test conditions
- 5.6.4 Final inspection, measurements and requirements
- 5.7 Solderability [Go to Page]
- 5.7.1 General
- 5.7.2 Test conditions
- 5.7.3 Final inspection, measurements and requirements
- 5.8 Rapid change of temperature (if required) [Go to Page]
- 5.8.1 General
- 5.8.2 Initial measurement
- 5.8.3 Test conditions
- 5.8.4 Recovery
- 5.9 Vibration [Go to Page]
- 5.9.1 General
- 5.9.2 Test conditions
- 5.9.3 Final inspection, measurements and requirements
- 5.10 Bump (repetitive shock) [Go to Page]
- 5.10.1 General
- 5.10.2 Initial measurements
- 5.10.3 Test conditions
- 5.10.4 Final inspection, measurements and requirements
- 5.11 Shock (non-repetitive shock) [Go to Page]
- 5.11.1 General
- 5.11.2 Initial measurements
- 5.11.3 Test conditions
- 5.11.4 Final inspection, measurements and requirements
- 5.12 Climatic sequence [Go to Page]
- 5.12.1 General
- 5.12.2 Initial measurements
- 5.12.3 Dry heat
- 5.12.4 Damp heat, cyclic, Test Db, first cycle
- 5.12.5 Cold
- 5.12.6 Low air pressure
- 5.12.7 Damp heat, cyclic, Test Db, remaining cycles
- 5.13 Damp heat, steady state [Go to Page]
- 5.13.1 General
- 5.13.2 Initial measurement
- 5.13.3 Test conditions
- 5.13.4 Recovery
- 5.13.5 Final inspection, measurements and requirements
- 5.14 Endurance [Go to Page]
- 5.14.1 General
- 5.14.2 Initial measurement
- 5.14.3 Test conditions
- 5.14.4 Recovery
- 5.14.5 Final inspection, measurements and requirements
- 5.15 Component solvent resistance (if required)
- 5.16 Solvent resistance of the marking (if required)
- 6 Marking [Go to Page]
- 6.1 General
- 6.2 Information for marking
- 6.3 Marking for code of temperature coefficient
- 6.4 Marking on the body
- 6.5 Marking of the packaging
- 6.6 Additional marking
- 7 Information to be given in a detail specification [Go to Page]
- 7.1 General
- 7.2 Outline drawing and dimensions
- 7.3 Mounting
- 7.4 Ratings and characteristics [Go to Page]
- 7.4.1 General
- 7.4.2 Nominal capacitance range
- 7.4.3 Particular characteristics
- 7.4.4 Soldering
- 7.5 Marking
- 8 Quality assessment procedures [Go to Page]
- 8.1 Primary stage of manufacture
- 8.2 Structurally similar components
- 8.3 Certified test records of released lots
- 8.4 Qualification approval [Go to Page]
- 8.4.1 General
- 8.4.2 Qualification approval on the basis of the fixed sample size procedure
- 8.4.3 Tests
- Annexes [Go to Page]
- Annex A (informative) Figures with limits of variation of capacitance with temperature for certain temperature coefficients and classes
- Annex B (normative) Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
- Annex C (normative) Quality conformance inspection [Go to Page]
- C.1 Formation of inspection lots [Go to Page]
- C.1.1 Groups A and B inspection
- C.1.2 Group C inspection
- C.2 Test schedule
- C.3 Delayed delivery
- C.4 Assessment levels
- C.5 Test schedule for quality conformance inspection
- Annex X (informative) Comparison of cross-references in relation to IEC 60384-8:2015
- Bibliography
- Figures [Go to Page]
- Figure A.1 – α: +100 (10–6/K)
- Figure A.2 – α: 0 (10–6/K)
- Figure A.3 – α: −33 (10–6/K)
- Figure A.4 – α: −75 (10–6/K)
- Figure A.5 – α: −150 (10–6/K)
- Figure A.6 – α: −220 (10–6/K)
- Figure A.7 – α: −330 (10–6/K)
- Figure A.8 – α: −470 (10–6/K)
- Figure A.9 – α: −750 (10–6/K)
- Figure A.10 – α: −1 000 (10–6/K)
- Figure A.11 – α: −1 500 (10–6/K)
- Figure A.12 – α: −2 200 (10–6/K)
- Figure A.13 – α: −3 300 (10–6/K)
- Figure A.14 – α: −4 700 (10–6/K)
- Figure A.15 – α: −5 600 (10–6/K)
- Tables [Go to Page]
- Table 1 – Preferred tolerances on nominal capacitance
- Table 2 – Nominal temperature coefficient and tolerance for reference temperature 20 °C
- Table 3 – Combination of temperature coefficient and tolerance
- Table 4 – Tangent of loss angle
- Table 5 – Insulation resistance requirements
- Table 6 – Test voltages for single layer ceramic capacitors
- Table 7 – Test voltages for leaded multilayer ceramic capacitors
- Table 8 – Temperature cyclic drift limits
- Table 9 – Requirements
- Table 10 – Preferred severities (of non-repetitive shock)
- Table 11 – Maximum capacitance change
- Table 12 – Number of damp heat cycles
- Table 13 – Final inspection, measurements and requirements
- Table 14 –Test conditions for damp heat, steady state
- Table 15 – Final inspection, measurements and requirements
- Table 16 – Endurance test conditions
- Table 17 – Final inspection, measurements and requirements
- Table 18 – Sampling plan together with numbers of permissible non-conforming items for qualification approval tests, assessment level EZ
- Table 19 – Test schedule for qualification approval
- Table B.1 – Combination of temperature coefficients and tolerances for the reference temperature of 25 °C
- Table C.1 – Lot-by-lot inspection
- Table C.2 – Periodic tests
- Table C.3 – Test schedule for quality conformance inspection (lot by lot)
- Table C.4 – Test schedule for quality conformance inspection (Periodic test)
- Table X.1 – Comparison of cross-references between this document and the previous edition of IEC 60384-8 for clauses/subclauses/annexes
- Table X.2 – Reference to IEC 60384-8 for figure/table
- Français [Go to Page]
- SOMMAIRE
- AVANT-PROPOS
- 1 Domaine d’application
- 2 Références normatives
- 3 Termes et définitions
- 4 Valeurs assignées et caractéristiques préférentielles [Go to Page]
- 4.1 Caractéristiques préférentielles
- 4.2 Valeurs assignées préférentielles [Go to Page]
- 4.2.1 Température assignée
- 4.2.2 Tension assignée (UR)
- 4.2.3 Tension de catégorie (UC)
- 4.2.4 Valeurs préférentielles de la capacité nominale et des valeurs de tolérance associées
- 4.2.5 Coefficient de température (α)
- 5 Procédures d’essai et de mesure [Go to Page]
- 5.1 Généralités
- 5.2 Examen visuel et contrôle des dimensions
- 5.3 Essais électriques [Go to Page]
- 5.3.1 Capacité
- 5.3.2 Tangente de l’angle de perte (tan δ)
- 5.3.3 Résistance d’isolement (Ri)
- 5.3.4 Tension de tenue
- 5.4 Coefficient de température (α) et dérive de capacité après cycle thermique [Go to Page]
- 5.4.1 Généralités
- 5.4.2 Séchage préliminaire
- 5.4.3 Conditions de mesure
- 5.4.4 Exigences
- 5.5 Robustesse des sorties
- 5.6 Résistance à la chaleur de brasage [Go to Page]
- 5.6.1 Généralités
- 5.6.2 Mesure initiale
- 5.6.3 Conditions d’essai
- 5.6.4 Inspection finale, mesures et exigences
- 5.7 Brasabilité [Go to Page]
- 5.7.1 Généralités
- 5.7.2 Conditions d’essai
- 5.7.3 Inspection finale, mesures et exigences
- 5.8 Variations rapides de température (si cela est exigé) [Go to Page]
- 5.8.1 Généralités
- 5.8.2 Mesure initiale
- 5.8.3 Conditions d’essai
- 5.8.4 Rétablissement
- 5.9 Vibrations [Go to Page]
- 5.9.1 Généralités
- 5.9.2 Conditions d’essai
- 5.9.3 Inspection finale, mesures et exigences
- 5.10 Secousses (chocs répétitifs) [Go to Page]
- 5.10.1 Généralités
- 5.10.2 Mesure initiale
- 5.10.3 Conditions d’essai
- 5.10.4 Inspection finale, mesures et exigences
- 5.11 Choc (chocs non répétitifs) [Go to Page]
- 5.11.1 Généralités
- 5.11.2 Mesure initiale
- 5.11.3 Conditions d’essai
- 5.11.4 Inspection finale, mesures et exigences
- 5.12 Séquence climatique [Go to Page]
- 5.12.1 Généralités
- 5.12.2 Mesure initiale
- 5.12.3 Chaleur sèche
- 5.12.4 Chaleur humide, cyclique, essai Db, premier cycle
- 5.12.5 Froid
- 5.12.6 Basse pression atmosphérique
- 5.12.7 Chaleur humide, cyclique, essai Db, cycles restants
- 5.13 Chaleur humide, essai continu [Go to Page]
- 5.13.1 Généralités
- 5.13.2 Mesure initiale
- 5.13.3 Conditions d’essai
- 5.13.4 Rétablissement
- 5.13.5 Inspection finale, mesures et exigences
- 5.14 Endurance [Go to Page]
- 5.14.1 Généralités
- 5.14.2 Mesure initiale
- 5.14.3 Conditions d’essai
- 5.14.4 Rétablissement
- 5.14.5 Inspection finale, mesures et exigences
- 5.15 Résistance du composant aux solvants (si cela est exigé)
- 5.16 Résistance du marquage aux solvants (si cela est exigé)
- 6 Marquage [Go to Page]
- 6.1 Généralités
- 6.2 Informations pour le marquage
- 6.3 Marquage du code du coefficient de température
- 6.4 Marquage sur le corps
- 6.5 Marquage de l’emballage
- 6.6 Marquage supplémentaire
- 7 Informations à spécifier dans une spécification particulière [Go to Page]
- 7.1 Généralités
- 7.2 Dessin d’encombrement et dimensions
- 7.3 Montage
- 7.4 Valeurs assignées et caractéristiques [Go to Page]
- 7.4.1 Généralités
- 7.4.2 Gamme de capacités nominales
- 7.4.3 Caractéristiques particulières
- 7.4.4 Brasure
- 7.5 Marquage
- 8 Procédures d’assurance de la qualité [Go to Page]
- 8.1 Étape initiale de fabrication
- 8.2 Modèles associables
- 8.3 Rapports certifiés d’essais des lots acceptés
- 8.4 Homologation [Go to Page]
- 8.4.1 Généralités
- 8.4.2 Homologation basée sur la procédure avec un effectif d’échantillons fixe
- 8.4.3 Essais
- Annexes [Go to Page]
- Annexe A (informative) Figures donnant les limites de variation de capacité en fonction de la température, pour certains coefficients de température et certaines classes
- Annexe B (normative) Combinaison de coefficients de température et de tolérances pour la température de référence de 25 °C
- Annexe C (normative) Contrôle de conformité de la qualité [Go to Page]
- C.1 Constitution des lots de contrôle [Go to Page]
- C.1.1 Inspection des Groupes A et B
- C.1.2 Inspection du groupe C
- C.2 Programme d’essais
- C.3 Livraison différée
- C.4 Niveaux d’assurance
- C.5 Programme d’essais pour les contrôles de conformité de la qualité
- Annexe X (informative)Références croisées avec l’IEC 60384-8:2015
- Bibliographie
- Figures [Go to Page]
- Figure A.1 – α: +100 (10–6/K)
- Figure A.2 – α: 0 (10–6/K)
- Figure A.3 – α: −33 (10–6/K)
- Figure A.4 – α: −75 (10–6/K)
- Figure A.5 – α: −150 (10–6/K)
- Figure A.6 – α: −220 (10–6/K)
- Figure A.7 – α: −330 (10–6/K)
- Figure A.8 – α: −470 (10–6/K)
- Figure A.9 – α: −750 (10–6/K)
- Figure A.10 – α: −1 000 (10–6/K)
- Figure A.11 – α: −1 500 (10–6/K)
- Figure A.12 – α: −2 200 (10–6/K)
- Figure A.13 – α: −3 300 (10–6/K)
- Figure A.14 – α: −4 700 (10–6/K)
- Figure A.15 – α: –5 600 (10–6/K)
- Tableaux [Go to Page]
- Tableau 1 – Tolérances préférentielles sur la capacité nominale
- Tableau 2 – Coefficient de température nominale et tolérance pour la température de référence de 20 °C
- Tableau 3 – Combinaison du coefficient de température et de la tolérance
- Tableau 4 – Tangente de l’angle de perte
- Tableau 5 – Exigences relatives à la résistance d’isolement
- Tableau 6 – Tensions d’essai pour condensateurs céramique monocouches
- Tableau 7 – Tensions d’essai pour condensateurs céramique multicouches au plomb
- Tableau 8 – Limites de dérive après cycle thermique
- Tableau 9 – Exigences
- Tableau 10 – Sévérités préférentielles (d’un choc non répétitif)
- Tableau 11 – Variation de capacité maximale
- Tableau 12 – Nombre de cycles de chaleur humide
- Tableau 13 – Inspection finale, mesures et exigences
- Tableau 14 – Conditions d’essai pour la chaleur humide, essai continu
- Tableau 15 – Inspection finale, mesures et exigences
- Tableau 16 – Conditions d’essai d’endurance
- Tableau 17 – Inspection finale, mesures et exigences
- Tableau 18 – Plan d’échantillonnage avec nombre d’éléments non conformes admis pour les essais d’homologation, niveau d’évaluation EZ
- Tableau 19 – Programme d’essais pour l’homologation
- Tableau B.1 – Combinaison de coefficients de température et de tolérances pour la température de référence de 25 °C
- Tableau C.1 – Contrôle lot par lot
- Tableau C.2 – Essais périodiques
- Tableau C.3 – Programme d’essais pour le contrôle de conformité de la qualité (lot par lot)
- Tableau C.4 – Programme d’essais pour le contrôle de conformité de la qualité (essai périodique)
- Tableau X.1 – Références croisées avec les articles/paragraphes/annexes de l’édition précédente de l’IEC 60384-8
- Tableau X.2 – Références croisées avec les figures/tableaux de l’IEC 60384-8 [Go to Page]